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Advantage

The EVA100’s intuitive GUI offers a seamless test sequence environment

that supports diverse product development processes.

The test sequence editor eliminates the need for software development skills.

This new measurement tool drastically shortens learning curves,

and enables users to build a shared measurement

environment that can be used from R&D through to production test—all

with a single, compact testing unit.  This promotes communication and

feedback during evaluation and production, and helps to accelerate product

development across multiple processes.

EVA100

Powerful Support for Characteristics Evaluation, Functional Evaluation,

and Production Can do what you want, quickly

In recent years the number of smart devices we use has increased

significantly. The role of analog / sensor ICs has become critically

important. More than ever, higher performance, tighter accuracy

and longer reliability are required for these devices. To address

these challenges measurement systems need to have many

features while maintaining a very low test cost, and engineers

tasked with developing test programs require very good coding

skills plus in-depth operation knowledge of the test system.

Our new measurement system EVA100 enables easy, rapid

characterization, functional evaluation and mass production

evaluations of low pin count analog(*1) and mixed signal(*2) 

devices.

Our newly developed Software GUI is extremely intuitive,

requiring only drag & drop operation, enabling engineers to

create device focused measurement set ups in a very fast and

simple manner. Automatic report functions dramatically improve

the efficiency of deskwork, providing clear documentation and

data ready for publishing in device data sheets.

High speed Image Capture up to 4.8Gbps

The T2000 image sensor test solution can capture the image output from CMOS image sensors utilized

in applications including smartphones, security cameras, and automotive/industrial cameras.

Its dual bank memory configuration minimizes test time by storing data and transferring it to the IP

engine at the same time.

Differential Input

• MIPI D-PHY V2.1：4.8Gbps

• MIPI C-PHY V1.2：3.5Gsps

• MIPI A-PHY®　*Option

Capture Memory：1.024M pixel x 2bank

• Available to continuously store max. 64.000 frames of the image data

Enhanced Image Processing Engine for Higher-Resolution Image Sensors

Advantest’s new IPE4A (Image Processor Engine 4A) has achieved even faster high-speed image processing

compared to the previous IPE4. In conjunction with a specially developed image processing library,

it minimizes the increase in test time driven by ultra-high sensor resolution.

Maximum 64 DUT Parallel Test Capability Reduces Test Cost

The T2000 can measure multiple DUTs simultaneously, improving the productivity of image sensor chips

and lowering test costs. With a wide user area and a light source with an enlarged irradiation area,

it can perform parallel measurement of up to 64 DUTs.

Setting a New Standard

• High flexibility and ease-of-use due to a multi-functional mixed-signal architecture.

• Low cost of test with high parallelism.

• Increased throughput with pattern-controlled test conditions.

• Enhanced test efficiency using per-channel time measurements.

• Simple load board Design by Cross function port and matrix functionality.

• Best-in-class performance, including fast range switching hardware, fast switching relays and

concurrent hardware operation.

• Simplified coding enabled by the rapid development kit (RDK) software package, which provides 

a user-friendly environment for developing reusable code and implementing fast debugging.

• Wide coverage for testing on the same platform, from low-voltage communication PMICs to

high-voltage automotive ASSPs.

CMOS Image Sensor Test Solution

We provide a test solution that minimizes test cost by flexibly supporting measurement of the newest

CMOS image sensors with leading-edge high-speed interfaces.

Flexible Support for Multifunctional Image Sensors

CMOS image sensors have a variety of built-in functions including AD/DA and logic circuits.

By combining measurement modules according to the functions required for testing specific

image sensors, the T2000 achieves a scalable system configuration.

Best-In-Class Parallel Test Efficiency – Multi-Site Controller

As more DUTs (Devices Under Test) are measured simultaneously, overhead tends to increase,

and test times in general tend to be longer. However, the T2000 reduces test time and achieves

high throughput with highly efficient multi-site test technology that completely eliminates overhead.

Test Time Reduction – Concurrent Test

The T2000 supports concurrent test functionality which can execute complex device test in shorter

times. Concurrent test can be more easily achieved than in the past, as the T2000 can seamlessly

switch between sequential execution and parallel execution of multiple test items. In addition,

its concurrent test functionality enables users to rapidly develop test programs with short test times.

Test Cost Reduction

With up to 8.192 digital channels, the T2000 achieves more than twice the parallelism of the previous

model, reducing test cost.

Software

• Windows-based operating system.

• Rapid Development Kit (RDK) environment: allows easy coding, high code reusability, and fast and easy

debugging.

• Versatile offline environment: T2000 System Software Emulator.

• Intuitive debug tools: Wave Tool (Logic Analyzer, Oscilloscope), Shmoo, Pattern Editor, Block Diagram

Tool, etc.

• Reduces time to market: Test Condition Runtime Optimizer, Multi-session

Test Cost Reduction

With up to 8.192 digital channels, the T2000 achieves more than twice the parallelism of the previous

model, reducing test cost.

Software

• Windows-based operating system.

• Rapid Development Kit (RDK) environment: allows easy coding, high code reusability, and fast and easy debugging.

• Versatile offline environment: T2000 System Software Emulator.

• Intuitive debug tools: Wave Tool (Logic Analyzer, Oscilloscope), Shmoo, Pattern Editor, Block Diagram Tool, etc.

• Reduces time to market: Test Condition Runtime Optimizer, Multi-session

SoC Test Solution

High-performance, low-cost SoC test solution optimized for high-volume manufacturing of today’s complex consumer devices.

Achieve feature-rich capabilities with high precision

In the ever-evolving digital consumer market, devices are becoming more sophisticated and diversified

in terms of functionality with:

• Multi-Time Domain functionality for testing several frequency domains simultaneously.

• 1.6GDME realizes low cost of test by high parallel testing.

• DSP192A module supports 96-ch device power supply by high density mounting.

• Analog module (GPWGD) full-spec test, covering high-performance audio to video.

• PMU32E module capable of handling a broad spectrum of precision test including ADC/DAC linearity.

• 8GDM corresponds to high-speed interface device testing.

Flexibly combined with these test modules, T2000 provides customers with an optimized test solution for

consumer devices.

Features

While chipmakers enhance the functionality of semiconductor devices and increase

multi-functionality, they need to reduce development times.

Advantest’s T2000 is ideal for testing these devices.

Time to Market Reduction – Multi-Session

The T2000 makes it possible to develop device test programs efficiently with minimal investment.

 With the multi-site CPU architecture unique to the T2000. multiple users can log in to a single

test system at the same time, and perform debugging work independently. Up to eight people

can work simultaneously, contributing to both engineering cost savings and TTM reduction.

In addition, eight people can develop separate functions for the same device concurrently,

which greatly shortens development times.

Best-In-Class Parallel Test Efficiency – Multi-Site Controller

As more DUTs (Devices Under Test) are measured simultaneously, overhead tends to increase,

and test times in general tend to be longer. However, the T2000 reduces test time and achieves

high throughput with highly efficient multi-site test technology that completely eliminates overhead.

Test Time Reduction – Concurrent Test

The T2000 supports concurrent test functionality which can execute complex device test in shorter

times. Concurrent test can be more easily achieved than in the past, as the T2000 can seamlessly

switch between sequential execution and parallel execution of multiple test items. In addition,

its concurrent test functionality enables users to rapidly develop test programs with short test times.

Test Cost Reduction

With up to 8.192 digital channels, the T2000 achieves more than twice the parallelism of the previous

model, reducing test cost.

Overview

Flexible Platform Addresses Diverse Test Needs

SoC devices require small-lot high-mix manufacturing methods in the present

era of rapid generation change. Semiconductor manufacturers struggle with

requirements to reconfigure a test system in a short time.

The T2000 platform adopts a module architecture and can be flexibly reconfigured

by rearranging the necessary functional modules according to the application.

A rich variety of functional modules, including digital, high-performance analog,

power-mixed signals, and image capture, provide a wide range of test coverage

and offer solutions at optimal cost. This makes it possible to have a scalable 

system configuration ranging from an air cooling system with 13 slots to a liquid

cooling system with 52 slots and up to 8.192 channels.

Advantest provides compact solutions with reduced initial investment for development

and small lot productions, and high-efficiency multiple-DUT parallel measurement

solutions for high volume manufacturing. The T2000 responds quickly to market

needs with minimal capital investment.

DC Voltage/Current Generators/Calibrators

For Evaluating and Calibrating Precision Instruments and Circuits R6144 

Programmable DC Voltage/Current Generators

■ Large Capacity of Up To 32 V/160 mA

■ High Accuracy (0.03%), High Stability

■ Low Noise (3 mVp-p)

■ 50 ms Settling Time

The R6144 is precision voltage and current generators ideal for

evaluation of precision circuits and parts as well as calibration

of temperature controllers.

The units use a time-sharing D/A conversion circuit which

provides excellent linearity and stability. Settling time and

output noise are greatly reduced for higher reliability, allowing

construction of a high throughput measurement system.

GPIB and BCD parallel interfaces are provided as standard

features, enabling compatibility with a wide range of host

devices such as personal computers, sequencers or general

purpose I/O interfaces.

■ Up to 32 V/160 mA Voltage, Current Output

■ High Resolution (1 µV/100 nA steps)

■ High Accuracy Guaranteed For 6 Months: 0.03%

(Voltage), 0.035% (Current)

■ Low Noise Increases Measurement Reliability: 3

mVp-p, One-Fifth of Previous Models’ Noise Level

■ Reduced Settling Time Enables Improvements In

Throughput: 50 ms, One-Third of Previous Models’

Time

■ Built-In 160-Step Memory

■ All-Digit Continuous Variable Sweep Function

Enables Wider Range of Measurement Applications

■ Programs Written For Previous Model (TR6142)

Can Be Used Without Modifications