T6373 Capable of 32 DUTs in Parallel Testing for 10-12 bit LCD Driver ICs

Global demand for LCD driver ICs is growing in response to an

expected sky rocketing in popularity for LCD televisions,

as well as liquid crystal panels for cellular phones with increasingly

rich feature sets. Tracking these developments, LCD driver ICs

are also growing in both pin count and function ality.

This evolution, however, has added to the importance of keeping

production costslow. The T6373 LCD driver test system offers an

optimal solution for customers facing this paradox.

Reducing Cost of Test for LCD Drivers with Large Pin Counts

The T6373 can be equipped with a maximum of 3.072 LCD channels

and 512 I/O channels. It supports four device parallel test for 640-pin

and 720-pin driver ICs, which will dominate in the future.

For driver ICs with BIST circuits, it could support up to 32 driver ICs.

Support for the Newest Driver ICs

The T6373’s high-speed/pre cision digitizer and DC (LCD ch) test

 unitare configured for per-pin operation. When testing many-pin/precision

(10 bit/1024 gradation) driver ICs, this tester boasts throughput of up 

to 150% greater than that of its predecessor.

Improved Support for Leveraging Legacy (T6372) Assets

By offering legacy support for the well-established test software, the

T6373 allows the customer to use valuable test assets, such as test

program environments, test boards, and probe cards,that supported

its predecessor model.

While preserving maximum compatibility with previous test systems,

the T6373 also allows the customer to minimize test costs.