Scalable platform combines the versatility to test

all types of semiconductor devices with “smart”

per-pin capabilities, enabling the industry’s most

cost-efficient test solutions

Reducing the cost of test requires not only innovative

technology, but also an extendable system architecture to

ensure long equipment lifetime for the greatest return on

customers’ capital investments.  ADVANTEST’s V93000

Smart Scale test platform is the semiconductor industry’s

first scalable, highly cost-efficient ATE solution to meet

these criteria, addressing the needs of leading IDMs,

foundries, design houses and OSATs around the world.

Scalable Tester Classes

Systems are available in four different classes – designated A,

C, S and L – featuring different test head sizes to provide the

most effective solution for each user’s specific applications.

These compatible tester classes allow users to quickly and

easily move their semiconductor devices from one Smart Scale

class to another as IC production volumes change over time.