All-in-one system supports multifunctional testing of

DRAMs, NAND Flash devices, next-generation non

volatile memories and MCPs, the advanced memory

technologies at the heart of mobile electronics

To keep pace with users’ performance demands in the booming

market for mobile electronics, the semiconductors that drive smart

phones and tablet computers as well as the servers that support

them – primarily DRAMs, NAND Flash memories, multi-chip packages

(MCPs) and next-generation non-volatile memories including MRAM,

RRAM and PCM — are becoming faster and higher capacity.  This

raises the need for test solutions that have both the high functionality

to test today’s most advanced memory ICs and the cost-efficient

operation to address high-volume consumer markets.

The versatile T5833 memory test system combines industry

leading performance and low cost of test to maximize customers’

return on investment. The tester is designed to perform both wafer

sort and final test across a wide range of memory devices including

LPDDR3-DRAMs, MCPs, high-speed NAND flash memories and

next-generation non-volatile memory ICs.