The Nexview™ 650 metrology system is an inspection tool for automated

measurement of injection molding tooling, PCBs, glass panels and other

samples requiring an extended work volume up to 650 x 650 mm.

It provides 2D & 3D measurements of a variety of surface features with

sub-nanometer vertical precision and sub-micron lateral precision.

Powerful Performance

Coherence Scanning Interferometry (CSI) is the measurement technology

at the core of the Nexview™ 650 system.

This non-contact technique provides high-precision, and high-value surface

metrology benefits including:

• Measures virtually all types of surfaces, from rough to super smooth,

including thin films, steep slopes, and large steps.

• Sub-nanometer measurement precision is independent of field magnification

• Gage capable performance – exceptional precision and repeatability for the

most demanding production applications.

• SureScan™ vibration tolerance technology – robust operation in virtually any

environment.

• Mx™ software enables seamless data exchange with other ZYGO Profilers

including ZeGage™ Pro, NewView™ 9000. and Nexview™ NX2.