M4841

High-Throughput Device Handler

for Volume Production Testing of MCUs and DSPs

Today’s semiconductors are gain ing in complexity both in circuit

design and packaging, and continue to be challenged by high

volume applications that function in environments with wide-rang

ing temperature fluctuations.

Semiconductor test and handling equipment must evolve to meet

these requirements, in the same way it must adapt to increasing

demands for higher parallelism and higher throughput.

Unique in its class, ADVANTEST’s new M4841 Dynamic Test Handler

enables high-throughput parallel test for very high volumes of devices

and supports complex ICs and pack ages, including BGA, CSP and QFP.

Because of its advanced performance capabilities and features, the

M4841 is the optimal dynamic test handler for high volume production

of devices used in consumer products such as portable digital equipment

and automotive systems.