R3860A RF Component Analyzer

R3768/3770 Network Analyzers

Next-generation analyzer family – world’s fastest 5 µs/Point analyzer

Measurement frequency range from 300 kHz to 8 and 20 GHz, depending on model configuration

● World’s fastest 5 µs/point scan rate

2- to 4-port model options available

● System dynamic range of 125 dB (typical)

● Balanced measurements at 20 GHz

Communication services such as cell phones and wireless LANs have increased the use of multiple frequency bands, while at the same time terminals are becoming smaller.

These trends have led to the widespread use of RF modules that combine multiple functions.

In addition, for existing high-frequency components, the ability to perform increasingly complex measurements more efficiently is a critical goal as miniaturization and the wider use of balanced circuits become more widespread.

ADVANTEST has introduced a new generation of analyzers with the flexibility to handle all tasks requiring extremely high accuracy, high speed measurements and superior analysis capabilities.

The R3860A RF Component Analyzer is a new generation of analyzers that provides the flexibility to measure RF modules with a wide range of functions.

Its flexibility covers a wide range of uses from RF modules combining multiple functions to frequency conversion circuits and other active components.

The R3768/3770 network analyzers are high-performance, multi-port analyzers designed with an increased focus on measuring passive components.

Higher frequencies are also supported, with the R3680A*1/3768 supporting frequencies from 300 kHz to 8 GHz and the R3770 supporting frequencies from 300 kHz to 20 GHz.

All models feature software fixturing that enables real-time simulation of virtual matching circuits and normalized impedance conversion in addition to S-parameter analysis.

With the world’s fastest high-speed scanning speed of 5 µs/point, even complex analysis simulations can be completed immediately.

In addition, the multiport models enable software balance simulation and balance parameter analysis.

When used in conjunction with the flexible multi-window and multi-trace capabilities, these models also allow for instant measurement of complex analytical projects.

The large, high-visibility display is a key factor in improving analysis efficiency, as it simultaneously displays multi-port paths in addition to fixture simulation traces.