Best-In-Class Parallel Test Efficiency – Multi-Site Controller

As more DUTs (Devices Under Test) are measured simultaneously, overhead tends to increase,

and test times in general tend to be longer. However, the T2000 reduces test time and achieves

high throughput with highly efficient multi-site test technology that completely eliminates overhead.

Test Time Reduction – Concurrent Test

The T2000 supports concurrent test functionality which can execute complex device test in shorter

times. Concurrent test can be more easily achieved than in the past, as the T2000 can seamlessly

switch between sequential execution and parallel execution of multiple test items. In addition,

its concurrent test functionality enables users to rapidly develop test programs with short test times.

Test Cost Reduction

With up to 8.192 digital channels, the T2000 achieves more than twice the parallelism of the previous

model, reducing test cost.

Software

• Windows-based operating system.

• Rapid Development Kit (RDK) environment: allows easy coding, high code reusability, and fast and easy

debugging.

• Versatile offline environment: T2000 System Software Emulator.

• Intuitive debug tools: Wave Tool (Logic Analyzer, Oscilloscope), Shmoo, Pattern Editor, Block Diagram

Tool, etc.

• Reduces time to market: Test Condition Runtime Optimizer, Multi-session