Reducing cost of test by maximizing parallel test,allowing

flexible pin configurations

With greater test resourcesthan those of the T5377S, the T5383

supports greater device pin counts, and allows for higher levels of

parallelism:

up to 384 devices, 1.5 times greater than that of its prede cessor.

Also, its flexible pin assignment capability makes possible parallel

test with more flexibility and variety than ever before.

This granularity of tester resources optimizes test-cell configurations,

and further reduces cost of test.

Industry’s Fastest Test, Shortest Test Times

The T5383 operates at 286 MHz/572 Mbps, double the speed of T5377S,

making it the industry’s fastest offering in this product category.

This increased speed translates into shorter test times, as well as higher

fault coverage, including Known Good Die applications.

Further, enhanced memory repair analyzer hardware (the MRA4ev3

and DualAFMoption) delivers approximately double the throughput of

previous products. Faster processing speeds and dedicated high speed

data communications enable production bitmap yield learning. At the

same time, they prevent analysis times from increasing,even as device

counts and densities grow larger.