T5503

256-DUT Parallel Test Capacity for Mass Production Test of

High Speed DDR3-SDRAM Memory Devices

Broadband communications are now widely used in households and

businesses throughout the globe and expectations are growing for higher

quality and larger capacity applications including video, audio,and on-line content. 

The demand for low-power, very high-speed memory to drive these applications

is prompting the near-term transition from DDR2-SDRAM to DDR3-SDRAM.

DDR3’s increased performance, coupled with lower power requirements,

promise to measurably enhance the capabilities of equipment such as

PCs, notebooks and servers, as well as advanced consumer products

such as game consoles and HDTV.

Accompanying the shift from DDR2-SDRAM to the faster DDR3-SDRAM,

is a corresponding requirement from device manufacturers for higher-speed

and more accurate test capabilities, and an insistence on lowered test costs

for mass production of these new high-speed devices. Advantest’s T5503 8448

Channel Test Head addresses these needs, with superior throughput and lowered

test costs for high-speed manufacturing.