Setting a New Standard

• High flexibility and ease-of-use due to a multi-functional mixed-signal architecture.

• Low cost of test with high parallelism.

• Increased throughput with pattern-controlled test conditions.

• Enhanced test efficiency using per-channel time measurements.

• Simple load board Design by Cross function port and matrix functionality.

• Best-in-class performance, including fast range switching hardware, fast switching relays and

concurrent hardware operation.

• Simplified coding enabled by the rapid development kit (RDK) software package, which provides 

a user-friendly environment for developing reusable code and implementing fast debugging.

• Wide coverage for testing on the same platform, from low-voltage communication PMICs to

high-voltage automotive ASSPs.

CMOS Image Sensor Test Solution

We provide a test solution that minimizes test cost by flexibly supporting measurement of the newest

CMOS image sensors with leading-edge high-speed interfaces.

Flexible Support for Multifunctional Image Sensors

CMOS image sensors have a variety of built-in functions including AD/DA and logic circuits.

By combining measurement modules according to the functions required for testing specific

image sensors, the T2000 achieves a scalable system configuration.