Application-specific Configurations

This versatile platform is available in various configurations,

each optimized to meet the customer’s distinct performance

and economic requirements:

•  The V93000 Versatile Digital solution addresses all

aspects of testing digital ICs, from wafer sorting to high-end

characterization.

•  For ICs for mobile applications, the V93000 Wireless/RF

solution can handle up to 96 ports with true octal-site and

high multi-site parallel efficiency at a minimal cost of test.

•  The V93000 SOC solution performs economic testing of

high-volume, cost-sensitive ICs while satisfying the testing

challenges of the latest mixed-signal devices used in

consumer electronics.

Scalable Tester Classes

Systems are available in four different classes – designated A,

C, S and L – featuring different test head sizes to provide the

most effective solution for each user’s specific applications.

These compatible tester classes allow users to quickly and

easily move their semiconductor devices from one Smart Scale

class to another as IC production volumes change over time.