Solutions for Advanced CMOS

The V93000 Smart Scale generation is designed to meet

the challenges of testing advanced, high-integration CMOS

technology.  Increased test coverage, faster time-to-market

and superior test economics are achieved with industry

leading digital performance, high-speed I/O flexibility,

system-like stress testing, protocol-engine-per-pin™

capabilities, real-time memory emulation, SmartLoop™

testing of symmetrical high-speed interfaces and enhanced

SmarTest™ software functionality.

Smarter Testing

ADVANTEST’s V93000 Smart Scale generation incorporates

innovative per-pin testing capabilities.

Each pin can

run with its own clock domain to match the exact data

rate requirements of the device under test, providing full

test coverage.  In addition, the testers are equipped for

power supply modulation, jitter injection and protocol

communication