High-speed test solution

ADVANTEST’s T5503HS system provides an optimal test

solution for double-data-rate SDRAMs and other next

generation memory chips. The tester can operate at speeds

up to 4.5 Gbps, fast enough to perform full-coverage testing

of the most advanced memories. In addition, the system

uses individual level settings, I/O dead-band canceling and

data-bus inversion (DBI) to maximize throughput in testing

high-speed devices.

To further enhance test performance, the T5503HS

automatically generates cyclic redundancy check (CRC) codes

and command/address (CA) parity codes to match the I/O

data rates and address of any DUT. This enables quick and

efficient development of new test programs, which reduces the

demands on customers’ resources while also improving the

time to market for new semiconductor designs.

Optimized for productivity

Capable of testing of up to 512 DDR4-SDRAM devices

in parallel, the T5503HS is a cost-effective, high-volume

test solution. The system’s real-time source-synchronous

function enables high throughput.  Additionally, an advanced

timing-training capability helps to identify the most effective

test solution faster than other systems on the global market.

Together, these functions allow the T5503HS tester to achieve

much higher productivity than software-based systems.