Category: Advantest

The R3671 and R3681 also

have unique noise correction functions that enhances

their dynamic range (–84 dBc [typical]) for W-CDMA

adjacent leakage power (ACLP) measurements.

The R3671 and R3681 come standard with broadband

modulation analysis functions (bandwidth 25 MHz) as

well as RF measurement functions. By adding the

dedicated signal analysis options for the respective

communication systems to the R3671/3681, you can

expand the functionality of transmitter testers.

Furthermore, with an optional RF signal generator

that supports digital modulation, the R3671 and R3681

provide ease of implementation of the optimum testing

systems for evaluating high-frequency devices.

●Series Models Designed to Enable Selection of Optimum

Frequency Range

R3671 (20 Hz to 13 GHz):

Used for mobile communication bandwidths

R3681 (20 Hz to 32 GHz):

Used for various methods of research and development

●High-Performance Spectrum Analysis

●Flexible Digital Modulation Analysis

3GPP/cdma2000/GSM/Bluetooth®/W-LAN

●Digital Modulation RF SG That Can Be Mounted Inside

R3671: 50 MHz to 3 GHz

R3681: 50 MHz to 6 GHz

●Stable Measurement with More Digital Circuits

●Variety of User Interfaces and I/O Interfaces Supported

Large 12-inch TFT display (touch screen)

Mouse, keyboard, USB, LAN, GP-IB, VGA, and FDD interfaces

With growing data communications traffic, broadband

radio communication systems such as radio-LANs, are

being developed that employ various modulation formats.

For example, IMT-2000 and other mobile communication

systems already use multicarrier methods.

Broadband radio signals are already being used in the

RF band. To push this envelope for higher quality data

transmissions, researchers and developers are studying

higher frequency/broader band carriers. In this kind of

radio communications environment, new measuring

instruments are needed that are not only more efficient

than ever, but also more flexible to support new

test requirements and communication standards.

The R3671 and R3681 are one of these new measuring

instruments for this new era of test and measurement

requirements. The R3671 and R3681 are high performance

signal analyzers. Employing our unique RF technology,

the R3671 and R3681 achieve an Average

Display Noise Level of –158 dBm*1), a Third-Order

Intercept Point (TOI) specification of +26 dBm*2), and a

signal purity of –122 dBc/Hz*3) to enable measurements

over a wide dynamic range. 

Wide Bandwidth

The measurement range covers short wavelengths of 480 to

1000 nm and long wavelengths of 1000 to 1650 nm and is

selectable via a single switch operation.

High-speed Sampling

The Q8326 can measure wavelengths at a sampling speed of

five per second so that wavelength fluctuations caused by temperature

variations can be captured precisely.

Frequency and Deviation Displays

The Q8326 can not only display the wavelength but can also

be switched to display the frequency of the beam under measurement,

which is convenient for adjusting the oscillation

wavelength to the ITU-T grid. Since the deviation is displayed

using the keyed entry as the reference, wavelength fluctuations

of the LD caused by temperature variations can be viewed with

high resolution and high precision.

GPIB Provided as Standard

Standard provision of GPIB allows the Q8326 to be used as a

component for an automated measuring system utilizing fast sampling.

Applications

•Optimum for LD wavelength adjustment for DWDM due to

fast sampling measurement.

•Can be used as a wavelength standard for spectroscope calibration

due to high accuracy.

•Can be automated to measure the LD wavelength temperature

characteristics and wavelength current characteristics.

High Resolution

The Michelson interference method allows high resolution

measurements of up to 0.001 nm/100 MHz.

High Accuracy Measurements

Use of a He-Ne laser for the reference wavelength enables high

accuracy measurements of up to 2 ppm. In addition, since the

He-Ne laser oscillates with high stability, a 2 ppm measurement

accuracy is guaranteed over a long time period without recalibration.

Measures Optical Wavelength with High Accuracy of 2 ppm

and High Resolution of 0.001 nm.

● Fast sampling: Five measurements/sec.

● Frequency and deviation displays

Wavelength Meter Using He-Ne Laser as Reference Wavelength

The Q8326 is an optical wavelength meter that

measures an emission center wavelength with high resolution.

The Q8326 uses a He-Ne laser for the reference

wavelength and uses the Michelson interference

method to enable high accuracy measurement.

This wavelength meter achieves

fast sampling (five per second) which is optimum

for oscillation wavelength adjustment of

LD for DWDM. With the deviation display

function, wavelength fluctuations can also be

measured with high resolution and accuracy.

The 6243/6244 provides high accuracy with 4½-digit

source resolution and 5½-digit measurement resolution, a

variety of sweep functions, and a pulse measuring function

with a minimum pulse width of 1ms. Thus, it can be

used for a wide range of applications as a power source for

evaluation in research and development of semiconductors

and other electronic components or for characteristic test

systems in a production line.

For Characteristic Test for Transistor and FET

Synchronized operation

of the two units of the

6243/6244 allows characteristic

test of a transistor or FET. Id and Ig can be

measured simultaneously,

as controlling the source

timings of drain voltage

and gate voltage to protect

a device from stress.

● Linear, log and random

sweep functions

● Pulse measurement with

a minimum pulse of 1ms

● Me a s u r eme n t d e l a y

function for measurement timing control

● Source delay function

for source timing control

DC voltage/current source monitor ideal for

electronic circuit/component evaluation

by flexible source and measurement

l Wide ranging source/measurement

6243 Voltage: 0 to ±110V Current: 0 to ±2A

6244 Voltage: 0 to ±20V Current: 0 to ±10A

l 5½-digit display with 1μV/100pA (6243), 1μV/1nA (6244)

resolution in measurement

l Pulse measurement with a minimum pulse width of 1ms

l Sink-enabled bipolar output

The 6243/6244 is a DC voltage and current source/monitor

that offers wide ranging source and measurement as follows:

6243 Voltage: 0 to ±110V Current: 0 to ±2A

6244 Voltage: 0 to ±20V Current: 0 to ±10A

High-performance spectrum analysis

By taking full advantage of the latest RF technology, the R3681 can make measurements over a wide dynamic range.

Measurements are performed over a wide dynamic range:

●Average display noise level: -158 dBm (typical 1 GHz)

●Built-in preamplifier on: -168 dBm (RBW = 1 Hz, 1 GHz)

●1 dB compression point: +10 dBm (typical 200 MHz to 3.5 GHz)

●Third-order intercept (TOI): +26 dBm (typical 2 to 3.5 GHz)

●Signal purity (at 800 MHz)

10 kHz Offset: -120 dBc/Hz or more

1 MHz Offset: -140 dBc/Hz or more

10 MHz Offset: -155 dBc/Hz or higher

Built-in attenuator, 5 dB level (standard)

1 dB level attenuator (OPT.14)

●Resolution bandwidth (RBW): 1 Hz to 10 MHz (Sequences 1. 2. 3. and 5)

Display dynamic range: 10 dB/fixed

0.1 to 1 dB/div. (0.1 dB steps)

1 to 20 dB/div. (1 dB steps)

Steepness shape factor

Approximately 3 times the conventional value. This reduces the resolution of carrier near-field measurements.

R6552 Series

5 1/2-digit DMM with a Wide Range of

Applications

The R6552 Series is a digital multimeter designed for system or

bench use with the maximum display of 319999, featuring

GPIB and RS232 interfaces with full remote control capability.

It is capable of measuring DC voltage/current, AC voltage/

current, 4- or 2-wire resistance, low/power 4- or 2-wire resistance,

(AC+DC) AC voltage/current, frequencies, and diodes.

ADVANTEST’s unique multi-slope integral A/D conversion

method ensures high speed and high precision measurements.

The AC voltage/current measurement uses the true-RMS (true

effective value) method while the (AC+DC) AC voltage/current

measurement allows measurement of a true effective value of

the distortion wave including the DC components. In addition

to the FAST/MED/SLOW sampling modes of the conventional

models, the R6552 has BURST and LONG-IT modes as well.

D3286 Pulse Pattern Generator/Bit Error Detector

150 Mbps to 12.5 Gbps BER Performance Test System for SDH/SONET

D3286 Error Detector

SDH/SONET frame synchronization for system evaluation

Region-specific error detection for SDH frame and ATM cell measurements

Burst data measurement for loopback testing

Auto-search function to adjust the most suitable timing and voltages

Data and clock monitoring outputs

FD drive for storing measurement results and setup data

Graphical user interface (GUI) environment for an easy-to-understand operating environment

Ultra-high-speed digital telecommunication networks are being built to accommodate the transmission of high-capacity information in the multimedia era of the future.

To evaluate and analyze O/E and E/O modules and ultra-high-speed logic devices for multiplexers and repeaters in telecommunication systems

Evaluating and analyzing O/E and E/O modules and ultra-high-speed logic devices for multiplexers and repeaters in telecommunication systems requires the use of high-speed, high-quality signal sources.

The D3186 Pulse Pattern Generator/D3286 Error Detector provides excellent performance!

The D3186 Pulse Pattern Generator/D3286 Error Detector delivers excellent signals with high speed, high quality, and a variety of error-detection features over the 150 Mbps to 12.5 Gbps operating frequency range.

In addition, the D3186/D3286. with its 8 M-bit mass memory and ADVANTEST’s unique frame pattern generation capability, is the next generation of BER test systems.

The D3186/D3286 is a new generation of BER performance test systems compatible with STM-1 (155.52 M bps) to STM-64 (9.95 Gbps) in SDH/SONET.