Category: Advantest

The Q8384 Optical Spectrum Analyzer measures and evaluates ultra-high-speed optical DWDM transmission systems and optical components with high wavelength resolution and high accuracy.

The new high-end optical spectrum analyzer utilizes a new four-pass monochromator system to provide high wavelength resolution and wide dynamic range.

● 10 pm resolution bandwidth

● 20 pm wavelength accuracy (using Opt.)

● Wide dynamic range: 50 dB (±0.1 nm), 60 dB (±0.2 nm)

● Optical frequency display

● Accurate NF measurement of EDFAs

● Handles power levels up to +23 dBm (200 mW)

● Rich WDM analysis functions

● Provides limit line function for pass/fail analysis

In DWDM optical communications, accurate wavelength measurements of light sources are required. Evaluating these specifications requires optical spectrum analyzers with higher resolution bandwidth and wavelength accuracy.

To meet these stringent requirements, the Q8384 has the world’s highest wavelength resolution of 10 pm* and wavelength accuracy of 20 pm.

It also achieves 20 pm wavelength accuracy in the 1550 nm band. This high performance enables the Q8384 to accurately measure the oscillating wavelength characteristics of laser diodes.

DWDM optical communication systems also include wavelength division multiplexing channels.

DWDM optical communication systems also contain WDM channels spaced close to 50 GHz (0.4 nm).

In this environment, an optical spectrum analyzer with excellent dynamic range is required to separate the optical signal and measure the noise figure (NF) of the optical amplifier.

With a dynamic range of 50 dB at 0.1 nm and 60 dB at 0.2 nm, the Q8384 fully meets these requirements.

The instrument is equipped with an automatic optical amplifier NF measurement and calculation function, allowing the user to perform the measurement in a simple manner.

The Q8384 can be optionally equipped with a built-in reference wavelength light source and an EE-LED (Edge Light Emitting Diode).

When calibrated with this reference light source, the instrument ensures wavelength accuracy of 20 pm in the 1550 nm band.

Utilizing the EE-LED’s broadband light source, the Q8384 allows the user to easily measure and evaluate the transmission and loss characteristics of narrowband filters.

Optical Measuring Instruments and Optical Device Test Systems

Optical Spectrum Analyzer for Coherent Measurements

■Coherence measurement

■High-speed measurements at 1.5 sec/scan

Wide wavelength range from 0.35 micron to 1.75 micron

■Wavelength measurement accuracy of 0.1 nm

The Q8344A is an optical spectrum analyzer with a wide wavelength range from 0.35 to 1.75 µm.

By using a Fourier spectroscopy system with a Michelson interferometer, it is possible to analyze coherence that cannot be obtained with a dispersive spectroscopy system using a monochromator.

It demonstrates the ability to evaluate laser diodes for optical and video disks.

The Optical Measurement Instruments and Optical Devices Test System has a built-in He-Ne laser used as a reference wavelength with a wavelength accuracy of ± 0.1 nm (1.3 µm), which ensures long-term measurement stability even without wavelength calibration.

With a maximum wavelength resolution of 0.05 nm (0.85 µm), the Q8344A is suitable for measuring laser diodes with narrow mode intervals.

Measurement speeds of about 1.5 seconds (0.4 to 1.05 µm and 0.8 to 1.75 µm) are independent of the analysis span, so it can be used as a system component.

With its versatile display, analysis, and processing capabilities, the Q8344A can be used for a variety of component characterization applications, from light-emitting components such as laser diodes and LEDs to optical components such as optical fibers and filters.

Coherent Measurements

Since the Q8344A uses a Michelson interferometer, it can be used for coherence measurements. This feature makes it easy to evaluate the performance of noise suppression caused by the return light of laser diodes in video disks.

An analysis range of approximately ±10 mm enables measurement of the coherence length of SLDs (Super Light Emitting Diodes) used in fiber optic gyros.

●High-speed, high-precision measurement LD

●High-speed measurement option: 0.5 s

●Narrow coherence measurement resolution: 0.001 mm

●Ten times higher wavelength accuracy: ±0.01 nm (option)

●High wavelength resolution option: 0.01 nm at 650 nm

Wide range of measurement wavelengths: 350 nm to 1000 nm

●Compact and lightweight platform

High throughput capability

The Q8341 is an optical spectrum analyzer for visible radiation with a wavelength range of 350 nm to 1000 nm.

The Q8341 utilizes a Fourier spectroscopy system with a Michelson interferometer so that coherence can be measured.

With a narrow wavelength resolution of 0.01 nm, the Q8341 is very effective in evaluating not only CD/DVD laser diodes, but also blue-violet laser diodes.

In addition, the built-in He-Ne laser serves as a wavelength reference, ensuring high wavelength measurement accuracy of ±0.01 nm.

Finally, the Q8341’s fast measurement speed of 0.5 seconds* makes it ideal for evaluating the temperature characteristics of system components.

Coherent measurement resolution: 0.001 mm

● Wavelength resolution (650 nm):

0.05 nm (standard), 0.01 nm (option)

Peak wavelength measurement resolution of 0.001 nm

● Wavelength measurement accuracy:

±0.05 nm (standard), ±0.01 nm (option)

●Maximum input level: ±10 dBm

●Maximum coherence measurement length:

Approx. 10 mm (standard), Approx. 40 mm (option)

●Wavelength measurement range 350 to 1000 nm

●Small size and light weight

R3860A RF Component Analyzer

R3768/3770 Network Analyzers

Next-generation analyzer family – world’s fastest 5 µs/Point analyzer

Measurement frequency range from 300 kHz to 8 and 20 GHz, depending on model configuration

● World’s fastest 5 µs/point scan rate

2- to 4-port model options available

● System dynamic range of 125 dB (typical)

● Balanced measurements at 20 GHz

Communication services such as cell phones and wireless LANs have increased the use of multiple frequency bands, while at the same time terminals are becoming smaller.

These trends have led to the widespread use of RF modules that combine multiple functions.

In addition, for existing high-frequency components, the ability to perform increasingly complex measurements more efficiently is a critical goal as miniaturization and the wider use of balanced circuits become more widespread.

ADVANTEST has introduced a new generation of analyzers with the flexibility to handle all tasks requiring extremely high accuracy, high speed measurements and superior analysis capabilities.

The R3860A RF Component Analyzer is a new generation of analyzers that provides the flexibility to measure RF modules with a wide range of functions.

Its flexibility covers a wide range of uses from RF modules combining multiple functions to frequency conversion circuits and other active components.

The R3768/3770 network analyzers are high-performance, multi-port analyzers designed with an increased focus on measuring passive components.

Higher frequencies are also supported, with the R3680A*1/3768 supporting frequencies from 300 kHz to 8 GHz and the R3770 supporting frequencies from 300 kHz to 20 GHz.

All models feature software fixturing that enables real-time simulation of virtual matching circuits and normalized impedance conversion in addition to S-parameter analysis.

With the world’s fastest high-speed scanning speed of 5 µs/point, even complex analysis simulations can be completed immediately.

In addition, the multiport models enable software balance simulation and balance parameter analysis.

When used in conjunction with the flexible multi-window and multi-trace capabilities, these models also allow for instant measurement of complex analytical projects.

The large, high-visibility display is a key factor in improving analysis efficiency, as it simultaneously displays multi-port paths in addition to fixture simulation traces.

At 8.5 kg, the U3661 is the world’s lightest microwave spectrum analyzer, meeting the diverse needs of a wide range of communication systems.

The U3661 not only enhances the basic performance of a spectrum analyzer, but also includes many standard features such as power calculation and high-speed scanning.

The U3661’s compact, lightweight design and three-way power supply system, including batteries, make it the perfect analyzer for field measurements.

The unit also has a built-in RC232 interface for connection to a personal computer, facilitating flexible data management using standard memory cards.

Excellent basic performance and measurement applications

Wideband scanning

The U3661 can continuously scan a frequency bandwidth from 9 kHz to 26.5 GHz on a single screen. Harmonic measurements or spurious signal measurements over a wide bandwidth can be easily compared relative to the fundamental.

Outstanding signal purity

The U3661’s local oscillator is equipped with a precision synthesizer that achieves a signal purity of -100 dBc/Hz (at frequencies ≤3.2 GHz and an offset frequency of 10 kHz). It meets a variety of needs, from adjacent channel leakage power measurements at radio facilities to microwave equipment evaluation.

Occupied frequency bandwidth

The U3661 calculates the bandwidth for a specified power ratio based on the measured spectrum data and then displays it with a marker. In addition, it displays the occupied frequency bandwidth (OBW) and carrier frequency (FC).

Adjacent Channel Leakage Power

The U3661 obtains the total power from the measurement data on the screen. It then integrates the power over the specified bandwidth (BS) to obtain its ratio to the total power.

ACP POINT and ACP GRAPH measurement methods can be selected.

Features

Flexible combination – dual-channel plug-in system.

The Q8221 utilizes a dual-channel plug-in system. Various types of optical sensors and light sources are available as plug-in units. Both channels can be used independently or simultaneously. By using the desired combination of optical sensors and light sources, the Q8221 can handle a wide variety of applications.

High measurement accuracy.

Ensure accuracy over the entire power and wavelength range.

The Q8221’s optical sensors ensure a high accuracy of ±2.5% at the calibration point (short-wavelength sensors: Q82214 calibrated at 780nm; long-wavelength sensors: Q82208. Q82215. and Q82216 calibrated at 1300nm; Q82227 and Q82232 calibrated at 1550nm). In the broadband wavelength region, they ensure ±4.5% accuracy by compensating for the sensitivity curve at each sensor wavelength. In the broadband wavelength region, they ensure ±4.5% accuracy by compensating the sensitivity curve at each sensor wavelength. In addition, a linearity of ±0.5% is ensured. Not only in the calibration point, but also in the broadband wavelength region and at the level to be measured.

High Sensitivity Sensors

Noise level: -94 dBm.

The Q82208 and Q82232 optical sensors achieve high sensitivity by cooling the InGaAs photodiode. the Q82208. in particular, achieves -94 dBm. all three types are capable of measuring high power up to +10 dBm with high linearity. These sensors meet a wide range of user requirements for polarization correlation, return loss, and sensor type. They meet a wide range of measurement requirements.

High Power Input Optical Sensors (Q82227)

Maximum input power: +27 dBm

The Q82227 is suitable for long wavelength, high sensitivity and high power light. The sensor is capable of measuring optical inputs up to +27 dBm. Therefore, it is suitable for measuring the output of fiber-optic amplifiers, pump sources for fiber-optic amplifiers, and high-output devices (e.g., LDs for optical CATV). In addition, the Q82227 has a noise level of -80 dBm, so it can be used for measurements requiring a wide dynamic range.

Evaluating Optical Narrow Bandpass Filters for Wavelength Division Multiplexing

– High resolution: 0.01 nm (at 1.55 µm) 0.001 nm (at 0.5 µm)

1 GHz (in optical frequency mode)

– High wavelength accuracy: ±0.01 nm

– Measurement speed: 1 to 3.5 seconds

– Coherence analysis range: ±165 mm

Trend Monitoring Function

Input power and wavelength can be displayed as a digital readout, as well as a time-domain trend graph.

Printer and floppy disk drive are standard The system is equipped with a high-speed thermal printer capable of reproducing the display in less than 8 seconds.

In addition, the system is equipped with a floppy disk drive using MS-DOS for easy data storage and analysis.

In addition, data is stored in text format for easy analysis and processing on a personal computer. In addition, the stored data can be subsequently scaled.

Displayable optical frequency

In addition to the normal wavelength display mode, the measurement spectrum can also display the optical frequency.

Since light in terahertz units can be read directly, this is useful for measuring optical wavelength division multiplexing and chirping from LDs, as well as for analyzing Soliton transmission systems.

Coherence analysis of ±165 mm

Because the Q8347 uses a Michelson interferometer, the system is capable of performing coherence analysis.

This feature makes it easy to evaluate the noise rejection performance of a disc LD. In addition, the travel of the interferometer can be greatly increased to allow analysis over a range of ±165 mm.

As a result, more detailed analysis can be performed in addition to the conventional secondary maximum peak (α value).

Curve fitting function

The Q8347 offers sech2 and Gaussian function curve fitting. Therefore, it can be used for spectral analysis of soliton transmission systems.

List display

The peaks of spectrum or coherence data can be displayed as digital data containing up to 200 points.

The separation and level of each channel of an optical WDM transmission system can be seen at a glance.

The Q7750 optocope (optical network analyzer) is a revolutionary device for measuring optical transmission characteristics.

It can measure the amplitude/dispersion/group delay characteristics of incident and reflected light from optical devices at high speed and high resolution over the optical carrier frequency range.

In addition, it can easily measure various chromatic dispersion characteristics, including the zero-dispersion characteristics and dispersion slope characteristics of dispersion-shifted or non-zero-dispersion fibers.

Measurement using the phase-shift method enables high optical frequency resolution and wide dynamic range.

Batch Measurement of Optical Transmission Characteristics in the Optical Carrier Frequency Range The Q7750 is equipped with a variable wavelength light source.

The Q7750 is equipped with a variable wavelength light source that enables simultaneous measurement of transmission and reflection characteristics in the optical carrier frequency range by scanning a series of wavelengths (optical frequencies) (S21 and S11 as S-parameters).

The measurement parameters are shown in the table below. These parameters can be measured simultaneously in a single scan.

High optical frequency resolution

Optical frequency resolution: up to 50 MHz (converted to 0.4 pm according to wavelength)

The Q7750 has a maximum optical frequency resolution of 50 MHz, which enables measurements in the field of ultra-high-resolution optical carrier frequencies that were not previously possible.

Amplitude and chromatic dispersion characteristics of optical devices for DenseWDM or Ultra-Dense-WDM can be easily measured (channel steps: 100 GHz, 50 GHz, 25 GHz, etc.).

Selectable wavelength spans from 70 nm (maximum) to approximately 0.1 nm (minimum).

High-speed measurement

Measurement time Approx. 6.7 ms (per measurement point) Approx. www.cniacs.com 4 seconds (within the specified span) The interval between scans (measurement time) is approx. 4 seconds.

This means that the Q7750 can complete a measurement in 4 seconds, whereas the previous measurement process took several tens of seconds.

If the measurement time is too long, accurate results may not be obtained because the characteristics of the device under test may change due to environmental conditions such as temperature.

The Q7750 completes measurements in a short period of time, ensuring high-speed, accurate measurements that are unaffected by the temperature characteristics of the device under test.

Key Features

– Sensitivity -92 dBm

– Polarization correlation ±0.05 dB

– Resolution bandwidth accuracy ±2

– Power Measurement

– Pulsed light measurement

Operation

In addition to amplifier analysis, a variety of display modes are available, such as

– Overlay display,

– Comparison with memory contents,

– Display of two independent graphs (split screen),

– Power meter function,

– Use of multiple markers,

– Normalized and direct readout of transmission loss and

– Automatic bandwidth analysis (e.g. measurement of half-value widths based on RMS and envelope methods),

– Curve fitting over the IEC/IEEE bus and many other features facilitate operation of the analyzer and simplify analysis.

A standard internal disk drive is used as a storage medium. Stored binary data can be analyzed with the appropriate program under MS-Windows or copied to a file and printed out.

The high-speed built-in thermal printer prints out a hard copy of the measurement results with all setup parameters in less than 10 seconds. The built-in high-speed thermal printer prints a hard copy of the measurement results with all setup parameters in less than 8 seconds.

The R3267 series spectrum analyzers are high-performance, versatile analyzers (with basic features) that respond to customer needs for future public land mobile communications systems with high C/N ratios.

The Advantest R3267 spectrum analyzers provide accurate, repeatable measurements of high-quality digital signals in the 2GHz band ± within 1% frequency span accuracy and -154dBc/Hz dynamic range (typical).

In addition, its 10Hz to 10MHz resolution band with filters is capable of performing 70dB (typical, 5MHz offset) ACP measurements over W-CDMA, making it ideal for testing wideband signals.

Finally, the R3267 has a frequency range of 100Hz to 8GHz, allowing even high-frequency systems to be fully measured.

The front panel of the R3267 consists of the Display section, Power Switch/Connector section, Floppy Disk Drive section, Measurement section, Marker section, Save/Recall section, Display Control section, ENTRY section, REMOTE section, Control section, and Option section.

Remove dust from the exterior of the R3267 by wiping or brushing the surface with a soft cloth or small brush. Use a brush to remove dirt from around the panel keys. Hardened dirt can be removed with a cloth that has been soaked in water containing a mild detergent.

Normally, cleaning the display filter from the front is sufficient. However, if the inside of the filter or the LCD surface is dirty, you can detach the screen filter from the R3267 series by removing the two screws on the front and pulling forward on the right part of the filter. Clean www.cniacs.com the filter with a soft close.

■ Wide frequency range:

R3264:9kHz to 3.5GHz

R3267:100Hz to 8GHz

R3273 :100Hz to 26.5GHz

26.5GHz to 60GHz (External mixer option)

Synchronization available up to 325 GHz

■ Resolution bandwidth (RBW):

10 Hz to 10 MHz, 5MHz (analog)

1 Hz to 100 Hz (digital)

■ Wide dynamic range:-145dBc/Hz (2GHz band, typ.)

70dB or better for W-CDMA ACP measurement  (5MHz offset, typ.)

■ 1µs fast zero-span sweep

■ Simplified, Automated measurements for mobile communications

■ Digital modulation analysis options for 1G, 2G, and 3rd

Generation : PHS, PDC, IS-136. GSM, DECT, EDGE, GPRS IS-95. W-CDMA/3GPP, cdma2000. Bluetooth