Category: Industry Trends

Description:

The Advantest D3186 is a high-performance pulse pattern generator that generates seven types of pseudo-random (PRBS) patterns from 27-1 to 231-1. programmable (WORD) patterns.

Programmable (WORD) patterns, up to 8M bits, or frame patterns for SDH or SONET structures, at speeds ranging from 150 Mb/s to 12 Gb/s.

In addition, by combining the D3186 with the D3286 BER detector, it is possible to build a system for evaluating the BER of ultra-high-speed optical communication devices and compound semiconductors.

With the D3186. you can choose a built-in high-precision synthesized clock generator. Sixteen types of frequency memories are provided for fast frequency setting.

For PRBS mode, the marker ratio can be changed between www.cniacs.com 8 values. Payload type can be selected from WORD, PRBS and CID for FRAME mode.

ALTERNATE mode is available and can be switched on 2 modes (WORD and FRAME) to perform measurements.

Key Points:

Built-in high-precision synthesized clock generator

16 frequency memories are provided for fast frequency setting.

For PRBS mode, the marker ratio can be changed between 8 values.

ALTERNATE mode available

GPIB Features

Built-in floppy disk

Excellent waveform quality

Generation of SDH/SONET frame patterns

Large memory

Multi-channel output

Output waveform crosspoint variables

Burst signal output

Fiber optic loop test

Master/Slave

Specifications:

Frequency range: 150 MHz to 12 GHz (option 10), 150 MHz to 12.5 GHz (option 13)

Frequency setting resolution: 1 kHz

Frequency stability: ±10 ppm/year

Load impedance: 50 ohms

Frequency accuracy: 0.01 %

Output impedance: 50 ohms

Operating temperature: 0°C to +40°C, +20°C to +30°C (Option 72)

Operating humidity: 40% to 85% RH

Storage temperature: -20°C to +60°C

Storage humidity: 30% to 85% RH

Power supply: AC 100 V to 120 V, AC 220 V to 240 V, 48 to 63 Hz

Power consumption: 550 VA maximum

Mass: max. 42 kg

External dimensions: approx. 310 (H) X 424 (W) X 550 (D) mm

ADVANTEST’s Wave Scale™ generation of RF channel cards enables the V93000 single scalable platform to achieve industry leading parallelism and throughput in testing virtually all RF and mixed-signal semiconductor devices used in wireless communications. These cards empower the V93000 platform to conduct highly parallel multi-site and in-site parallel testing, achieving unprecedented performance.

All-in-One Test Solution

The flexible Wave Scale RF card is capable of testing the RF SoCs that drive LTE, LTE-Advanced and LTE-A Pro smart phones as well as LTE-M, WLAN, GPS, ZigBee, Bluetooth and IoT wireless applications.  In addition to handling today’s market requirements, it is designed with the extendibility to address projected technology changes toward the future of 5G networks.

Multi-Site and In-Site Parallel Testing

The Wave Scale RF uses an advanced architecture, allowing it to exceed the capabilities of traditional RF test solutions. 

While other systems test one RF standard per site at a time, www.cniacs.com this card enables simultaneous testing of multiple standards or multiple paths within each DUT.  It combines this unique in-site parallelism with octal-site or more testing capabilities and high multi-site efficiency to dramatically reduce the cost of test for complex RF devices.

High-Volume Capabilities

With four independent RF subsystems per board, the Wave Scale RF card can handle the individual stimulus and measurement frequencies needed to test the full spectrum of devices used in wireless communications. Each RF subsystem has eight ports, which fan out the RF signal, and up to four independent measurement instruments.  

With this configuration, each of the four RF subsystems can be used across as many as eight sites to run receiver and transmitter tests simultaneously with all internal RF paths also tested in parallel.  

The system can handle a total of up to 32 sites per card for IoT, Bluetooth and other devices. The innovative V93000 test processor controls and synchronizes the parallel and independent operation of all instruments.

Each of the card’s 32 RF ports can support up to 6 GHz for a bandwidth of 200 MHz. Additionally, internal loopback and embedded calibration standards contribute to the system’s highly integrated architecture.

The Single Scalable Test Platform

In the age of IoT, 5G and artificial intelligence, more than half of all the microchips manufactured in the world are tested by our equipment. As the industry’s leading manufacturer of automated test systems for semiconductor devices, we continuously revolutionize market standards and enable customers to shape their digital future.

Our V93000 platform addresses the latest industry challenges and enables applications like Artificial Intelligence (AI) & High-Performance Compute (HPC), medical devices, Advanced Driver Assistance Systems (ADAS), making the world safer, faster and our lives easier.

Thanks to the platform’s scalability and compatibility over multiple generations, V93000 is future proof and saves cost. The all-in-one platform covers a variety of different solutions like RF, digital, power and analog.

Large Installed Base

Staying focused on the single scalable platform strategy, Advantest has developed a significant installed base of V93000 test systems in both engineering and high-volume manufacturing. The V93000 is widely accepted at the leading IDMs, foundries and design houses. Outsourced IDMs and fabless companies find the V93000’s test capacity installed in all major OSATs worldwide.

V93000 EXA Scale – The New Generation

The V93000 EXA Scale™ SoC Test Systems are targeted www.cniacs.com at advanced digital ICs up to the exascale performance class. The EXA Scale generation of the V93000 provides solutions that enable new test methodologies to meet the challenges of these advanced digital devices and deliver lower Cost-of-Test (CoT) and faster Time-to-Market (TTM).

Today’s most advanced semiconductor processes allow for technology transformations that enable real-time integration of data from a countless number of sources such as IoT and handheld devices, automobiles and large servers to name a few. As mobile processors, Advanced Driver Assistance Systems (ADAS) processors, high-performance computing (HPC) and artificial intelligence (AI) ICs evolve, the amount of data being processed and the device power requirements continues to grow exponentially. Along with these advancements, new testing challenges, including exploding scan-data volumes, extreme power requirements, fast yield-learning, high pin-count, and high-multisite configurations need to be addressed. Advantest’s new V93000 EXA Scale generation addresses these challenges with innovative advancements on the proven V93000 architecture.

The V93000 EXA Scale system employs Advantest’s patented Xtreme Link technology, a communication network designed specifically for automatic test equipment (ATE). The technology provides high-speed data connections, embedded computing power, and instant card-to-card communication.

The Cross Domain Analyzer U3800 Series is a vector and spectrum-signal analyzer with built-in two-channel RF input function. This is the industry’s first metrology tool that enables comparative measurement/analysis of the signals from two channels on the basis of their time, amplitude, phase, and frequency domains by simultaneous and synchronized measurement. 

This Cross Domain Analyzer has the following features and functions:

 ● Two-channel RF input and wide frequency range

 ● The best-in-class time domain analysis bandwidth of 40 MHz

 ● Vector operation that allows composition/decomposition

 U3800 Series allow the users to easily measure and analyze multiplexed/mixed/interfered signals so that complex signal analyses that are conven

tionally difficult to perform, such as multipath analysis, electromagnetic field decomposition, and inter-circuit interference, can be carried out. 

U3800 Series consists of analyzers applicable to www.cniacs.com a wide variety of fields such as broadcasting, telecommunication, and EMC.

A new field of RF measurement—Concept of Cross Domain

”We want to freely compare two RF signals in different analytical domains so that measurement and comparison of two signals that change with time, such as those in transient phenomena, modulating waves, and EMC noise can be achieved by means of a vector operation.” In order to satisfy such requirements, we have developed a measurement equipment that can easily measure, compare, and 

analyze true momentary signals, which is difficult in the case of conventional measurement equipments, by equipping it with a two-channel phase-locked loop vector measurement function and operation function.

Key performance of the U3800 Series

● World’s first two-channel simultaneous/parallel measurement in the analysis bandwidth (maximum: 40 MHz)

● Vector comparison with high sensitivity and wide dynamic range (pre-amplifier equipped as standard) 

● U3800 Series to support 9 kHz to 43 GHz of measurement frequencies

3 GHz Cross Domain Analyzer  U3841: 9 kHz to 3 GHz  

8 GHz Cross Domain Analyzer  U3851: 9 kHz to 8 GHz  

43 GHz Cross Domain Analyzer  U3872: 9 kHz to 43 GHz