Features

– 32 optically coupled outputs

– 32 optically coupled inputs

– High isolation potential – 1kV continuous – 35kV pulsed

– 8-bit, 16-bit, 32-bit data transfer

– Standard data or short I/O addressing A16 or A24

– Voltage-sensing or contact-sensing inputs

– Input range 5 to 125VDC

– 300mA sink current output

– Maximum output voltage 50V

– Inputs and outputs support built-in testing

Functional Features

Board Features: The board has 32 optically coupled inputs and 32 optically coupled outputs.

The outputs and inputs have built-in testing and provide continuous 1kV system isolation for the VME backplane.

Compliance The board conforms to the VMEbus specification ANSI/IEEE STD 1014-1987 IEC 821 and 297 with the following helpers:

a24/a16. d32/d16/d08 (eo)

Slave devices using the following address modifiers:

3D, 39/2D, 29.

BUILT-IN TEST: The VMIVME-2536 supports both on-line and off-line built-in tests (BIT).

By setting a bit in the Control and Status Register (CSR), the input will enter test mode.

In test mode, data placed in the on-board test registers is read through the input port instead of field data.

The address of the test register is the same as the address of the input data port.

The address of the test register is the same as the address of the input data port, so testing can be accomplished by simply writing to and reading from the input data port. This feature can be used for both on-line and off-line testing.

The contents of the output data register can be read at any time, thus supporting online testing. The outputs can be put into offline test mode by setting a bit in the CSR.

In offline test mode, all open collector outputs are disabled. Data patterns can then be written to or read from the output registers to perform tests without affecting the outputs.