Output Data Transfer:

Data for each analog output

channel is written directly into an on-board register

location dedicated to a specific channel.  The data is

then periodically retrieved from the register, and

converted to an analog voltage which is transferred to

one of 32 output sample-and-hold buffers.

A/D Data Format (Built-in-Test Data):

Analog

inputs are first digitized, then the 12-bit digital values

(D11 to D00) are read at a single memory word location.

In two’s complement mode, the upper four bits (D15.

D14. D13. and D12) are read as the sign extension of the

12-bit digital value, otherwise they are read as logical zeros.

Built-in-Testing:

Built-in-Test logic provides the user

with the capability to test all of the active components on

the board, including the output switches. This test

scheme utilizes an on-board analog-to-digital converter

(ADC) and multiplexers, as shown in Figure 1.

Memory Testing:

This product is designed with

dual-port on-board registers that may be tested by

executing a user-defined memory test program for

additional performance verification.

System Reset:

Application of the system reset signal

via the VMEbus initializes the board into a state with all

analog outputs disconnected from the output.