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D3286 Pulse Pattern Generator/Bit Error Detector

150 Mbps to 12.5 Gbps BER Performance Test System for SDH/SONET

D3286 Error Detector

SDH/SONET frame synchronization for system evaluation

Region-specific error detection for SDH frame and ATM cell measurements

Burst data measurement for loopback testing

Auto-search function to adjust the most suitable timing and voltages

Data and clock monitoring outputs

FD drive for storing measurement results and setup data

Graphical user interface (GUI) environment for an easy-to-understand operating environment

Ultra-high-speed digital telecommunication networks are being built to accommodate the transmission of high-capacity information in the multimedia era of the future.

To evaluate and analyze O/E and E/O modules and ultra-high-speed logic devices for multiplexers and repeaters in telecommunication systems

Evaluating and analyzing O/E and E/O modules and ultra-high-speed logic devices for multiplexers and repeaters in telecommunication systems requires the use of high-speed, high-quality signal sources.

The D3186 Pulse Pattern Generator/D3286 Error Detector provides excellent performance!

The D3186 Pulse Pattern Generator/D3286 Error Detector delivers excellent signals with high speed, high quality, and a variety of error-detection features over the 150 Mbps to 12.5 Gbps operating frequency range.

In addition, the D3186/D3286. with its 8 M-bit mass memory and ADVANTEST’s unique frame pattern generation capability, is the next generation of BER test systems.

The D3186/D3286 is a new generation of BER performance test systems compatible with STM-1 (155.52 M bps) to STM-64 (9.95 Gbps) in SDH/SONET.

The Q8384 Optical Spectrum Analyzer measures and evaluates ultra-high-speed optical DWDM transmission systems and optical components with high wavelength resolution and high accuracy.

The new high-end optical spectrum analyzer utilizes a new four-pass monochromator system to provide high wavelength resolution and wide dynamic range.

● 10 pm resolution bandwidth

● 20 pm wavelength accuracy (using Opt.)

● Wide dynamic range: 50 dB (±0.1 nm), 60 dB (±0.2 nm)

● Optical frequency display

● Accurate NF measurement of EDFAs

● Handles power levels up to +23 dBm (200 mW)

● Rich WDM analysis functions

● Provides limit line function for pass/fail analysis

In DWDM optical communications, accurate wavelength measurements of light sources are required. Evaluating these specifications requires optical spectrum analyzers with higher resolution bandwidth and wavelength accuracy.

To meet these stringent requirements, the Q8384 has the world’s highest wavelength resolution of 10 pm* and wavelength accuracy of 20 pm.

It also achieves 20 pm wavelength accuracy in the 1550 nm band. This high performance enables the Q8384 to accurately measure the oscillating wavelength characteristics of laser diodes.

DWDM optical communication systems also include wavelength division multiplexing channels.

DWDM optical communication systems also contain WDM channels spaced close to 50 GHz (0.4 nm).

In this environment, an optical spectrum analyzer with excellent dynamic range is required to separate the optical signal and measure the noise figure (NF) of the optical amplifier.

With a dynamic range of 50 dB at 0.1 nm and 60 dB at 0.2 nm, the Q8384 fully meets these requirements.

The instrument is equipped with an automatic optical amplifier NF measurement and calculation function, allowing the user to perform the measurement in a simple manner.

The Q8384 can be optionally equipped with a built-in reference wavelength light source and an EE-LED (Edge Light Emitting Diode).

When calibrated with this reference light source, the instrument ensures wavelength accuracy of 20 pm in the 1550 nm band.

Utilizing the EE-LED’s broadband light source, the Q8384 allows the user to easily measure and evaluate the transmission and loss characteristics of narrowband filters.

Optical Measuring Instruments and Optical Device Test Systems

Optical Spectrum Analyzer for Coherent Measurements

■Coherence measurement

■High-speed measurements at 1.5 sec/scan

Wide wavelength range from 0.35 micron to 1.75 micron

■Wavelength measurement accuracy of 0.1 nm

The Q8344A is an optical spectrum analyzer with a wide wavelength range from 0.35 to 1.75 µm.

By using a Fourier spectroscopy system with a Michelson interferometer, it is possible to analyze coherence that cannot be obtained with a dispersive spectroscopy system using a monochromator.

It demonstrates the ability to evaluate laser diodes for optical and video disks.

The Optical Measurement Instruments and Optical Devices Test System has a built-in He-Ne laser used as a reference wavelength with a wavelength accuracy of ± 0.1 nm (1.3 µm), which ensures long-term measurement stability even without wavelength calibration.

With a maximum wavelength resolution of 0.05 nm (0.85 µm), the Q8344A is suitable for measuring laser diodes with narrow mode intervals.

Measurement speeds of about 1.5 seconds (0.4 to 1.05 µm and 0.8 to 1.75 µm) are independent of the analysis span, so it can be used as a system component.

With its versatile display, analysis, and processing capabilities, the Q8344A can be used for a variety of component characterization applications, from light-emitting components such as laser diodes and LEDs to optical components such as optical fibers and filters.

Coherent Measurements

Since the Q8344A uses a Michelson interferometer, it can be used for coherence measurements. This feature makes it easy to evaluate the performance of noise suppression caused by the return light of laser diodes in video disks.

An analysis range of approximately ±10 mm enables measurement of the coherence length of SLDs (Super Light Emitting Diodes) used in fiber optic gyros.

●High-speed, high-precision measurement LD

●High-speed measurement option: 0.5 s

●Narrow coherence measurement resolution: 0.001 mm

●Ten times higher wavelength accuracy: ±0.01 nm (option)

●High wavelength resolution option: 0.01 nm at 650 nm

Wide range of measurement wavelengths: 350 nm to 1000 nm

●Compact and lightweight platform

High throughput capability

The Q8341 is an optical spectrum analyzer for visible radiation with a wavelength range of 350 nm to 1000 nm.

The Q8341 utilizes a Fourier spectroscopy system with a Michelson interferometer so that coherence can be measured.

With a narrow wavelength resolution of 0.01 nm, the Q8341 is very effective in evaluating not only CD/DVD laser diodes, but also blue-violet laser diodes.

In addition, the built-in He-Ne laser serves as a wavelength reference, ensuring high wavelength measurement accuracy of ±0.01 nm.

Finally, the Q8341’s fast measurement speed of 0.5 seconds* makes it ideal for evaluating the temperature characteristics of system components.

Coherent measurement resolution: 0.001 mm

● Wavelength resolution (650 nm):

0.05 nm (standard), 0.01 nm (option)

Peak wavelength measurement resolution of 0.001 nm

● Wavelength measurement accuracy:

±0.05 nm (standard), ±0.01 nm (option)

●Maximum input level: ±10 dBm

●Maximum coherence measurement length:

Approx. 10 mm (standard), Approx. 40 mm (option)

●Wavelength measurement range 350 to 1000 nm

●Small size and light weight

R3860A RF Component Analyzer

R3768/3770 Network Analyzers

Next-generation analyzer family – world’s fastest 5 µs/Point analyzer

Measurement frequency range from 300 kHz to 8 and 20 GHz, depending on model configuration

● World’s fastest 5 µs/point scan rate

2- to 4-port model options available

● System dynamic range of 125 dB (typical)

● Balanced measurements at 20 GHz

Communication services such as cell phones and wireless LANs have increased the use of multiple frequency bands, while at the same time terminals are becoming smaller.

These trends have led to the widespread use of RF modules that combine multiple functions.

In addition, for existing high-frequency components, the ability to perform increasingly complex measurements more efficiently is a critical goal as miniaturization and the wider use of balanced circuits become more widespread.

ADVANTEST has introduced a new generation of analyzers with the flexibility to handle all tasks requiring extremely high accuracy, high speed measurements and superior analysis capabilities.

The R3860A RF Component Analyzer is a new generation of analyzers that provides the flexibility to measure RF modules with a wide range of functions.

Its flexibility covers a wide range of uses from RF modules combining multiple functions to frequency conversion circuits and other active components.

The R3768/3770 network analyzers are high-performance, multi-port analyzers designed with an increased focus on measuring passive components.

Higher frequencies are also supported, with the R3680A*1/3768 supporting frequencies from 300 kHz to 8 GHz and the R3770 supporting frequencies from 300 kHz to 20 GHz.

All models feature software fixturing that enables real-time simulation of virtual matching circuits and normalized impedance conversion in addition to S-parameter analysis.

With the world’s fastest high-speed scanning speed of 5 µs/point, even complex analysis simulations can be completed immediately.

In addition, the multiport models enable software balance simulation and balance parameter analysis.

When used in conjunction with the flexible multi-window and multi-trace capabilities, these models also allow for instant measurement of complex analytical projects.

The large, high-visibility display is a key factor in improving analysis efficiency, as it simultaneously displays multi-port paths in addition to fixture simulation traces.