At 8.5 kg, the U3661 is the world’s lightest microwave spectrum analyzer, meeting the diverse needs of a wide range of communication systems.

The U3661 not only enhances the basic performance of a spectrum analyzer, but also includes many standard features such as power calculation and high-speed scanning.

The U3661’s compact, lightweight design and three-way power supply system, including batteries, make it the perfect analyzer for field measurements.

The unit also has a built-in RC232 interface for connection to a personal computer, facilitating flexible data management using standard memory cards.

Excellent basic performance and measurement applications

Wideband scanning

The U3661 can continuously scan a frequency bandwidth from 9 kHz to 26.5 GHz on a single screen. Harmonic measurements or spurious signal measurements over a wide bandwidth can be easily compared relative to the fundamental.

Outstanding signal purity

The U3661’s local oscillator is equipped with a precision synthesizer that achieves a signal purity of -100 dBc/Hz (at frequencies ≤3.2 GHz and an offset frequency of 10 kHz). It meets a variety of needs, from adjacent channel leakage power measurements at radio facilities to microwave equipment evaluation.

Occupied frequency bandwidth

The U3661 calculates the bandwidth for a specified power ratio based on the measured spectrum data and then displays it with a marker. In addition, it displays the occupied frequency bandwidth (OBW) and carrier frequency (FC).

Adjacent Channel Leakage Power

The U3661 obtains the total power from the measurement data on the screen. It then integrates the power over the specified bandwidth (BS) to obtain its ratio to the total power.

ACP POINT and ACP GRAPH measurement methods can be selected.

Features

Flexible combination – dual-channel plug-in system.

The Q8221 utilizes a dual-channel plug-in system. Various types of optical sensors and light sources are available as plug-in units. Both channels can be used independently or simultaneously. By using the desired combination of optical sensors and light sources, the Q8221 can handle a wide variety of applications.

High measurement accuracy.

Ensure accuracy over the entire power and wavelength range.

The Q8221’s optical sensors ensure a high accuracy of ±2.5% at the calibration point (short-wavelength sensors: Q82214 calibrated at 780nm; long-wavelength sensors: Q82208. Q82215. and Q82216 calibrated at 1300nm; Q82227 and Q82232 calibrated at 1550nm). In the broadband wavelength region, they ensure ±4.5% accuracy by compensating for the sensitivity curve at each sensor wavelength. In the broadband wavelength region, they ensure ±4.5% accuracy by compensating the sensitivity curve at each sensor wavelength. In addition, a linearity of ±0.5% is ensured. Not only in the calibration point, but also in the broadband wavelength region and at the level to be measured.

High Sensitivity Sensors

Noise level: -94 dBm.

The Q82208 and Q82232 optical sensors achieve high sensitivity by cooling the InGaAs photodiode. the Q82208. in particular, achieves -94 dBm. all three types are capable of measuring high power up to +10 dBm with high linearity. These sensors meet a wide range of user requirements for polarization correlation, return loss, and sensor type. They meet a wide range of measurement requirements.

High Power Input Optical Sensors (Q82227)

Maximum input power: +27 dBm

The Q82227 is suitable for long wavelength, high sensitivity and high power light. The sensor is capable of measuring optical inputs up to +27 dBm. Therefore, it is suitable for measuring the output of fiber-optic amplifiers, pump sources for fiber-optic amplifiers, and high-output devices (e.g., LDs for optical CATV). In addition, the Q82227 has a noise level of -80 dBm, so it can be used for measurements requiring a wide dynamic range.

Evaluating Optical Narrow Bandpass Filters for Wavelength Division Multiplexing

– High resolution: 0.01 nm (at 1.55 µm) 0.001 nm (at 0.5 µm)

1 GHz (in optical frequency mode)

– High wavelength accuracy: ±0.01 nm

– Measurement speed: 1 to 3.5 seconds

– Coherence analysis range: ±165 mm

Trend Monitoring Function

Input power and wavelength can be displayed as a digital readout, as well as a time-domain trend graph.

Printer and floppy disk drive are standard The system is equipped with a high-speed thermal printer capable of reproducing the display in less than 8 seconds.

In addition, the system is equipped with a floppy disk drive using MS-DOS for easy data storage and analysis.

In addition, data is stored in text format for easy analysis and processing on a personal computer. In addition, the stored data can be subsequently scaled.

Displayable optical frequency

In addition to the normal wavelength display mode, the measurement spectrum can also display the optical frequency.

Since light in terahertz units can be read directly, this is useful for measuring optical wavelength division multiplexing and chirping from LDs, as well as for analyzing Soliton transmission systems.

Coherence analysis of ±165 mm

Because the Q8347 uses a Michelson interferometer, the system is capable of performing coherence analysis.

This feature makes it easy to evaluate the noise rejection performance of a disc LD. In addition, the travel of the interferometer can be greatly increased to allow analysis over a range of ±165 mm.

As a result, more detailed analysis can be performed in addition to the conventional secondary maximum peak (α value).

Curve fitting function

The Q8347 offers sech2 and Gaussian function curve fitting. Therefore, it can be used for spectral analysis of soliton transmission systems.

List display

The peaks of spectrum or coherence data can be displayed as digital data containing up to 200 points.

The separation and level of each channel of an optical WDM transmission system can be seen at a glance.

The Q7750 optocope (optical network analyzer) is a revolutionary device for measuring optical transmission characteristics.

It can measure the amplitude/dispersion/group delay characteristics of incident and reflected light from optical devices at high speed and high resolution over the optical carrier frequency range.

In addition, it can easily measure various chromatic dispersion characteristics, including the zero-dispersion characteristics and dispersion slope characteristics of dispersion-shifted or non-zero-dispersion fibers.

Measurement using the phase-shift method enables high optical frequency resolution and wide dynamic range.

Batch Measurement of Optical Transmission Characteristics in the Optical Carrier Frequency Range The Q7750 is equipped with a variable wavelength light source.

The Q7750 is equipped with a variable wavelength light source that enables simultaneous measurement of transmission and reflection characteristics in the optical carrier frequency range by scanning a series of wavelengths (optical frequencies) (S21 and S11 as S-parameters).

The measurement parameters are shown in the table below. These parameters can be measured simultaneously in a single scan.

High optical frequency resolution

Optical frequency resolution: up to 50 MHz (converted to 0.4 pm according to wavelength)

The Q7750 has a maximum optical frequency resolution of 50 MHz, which enables measurements in the field of ultra-high-resolution optical carrier frequencies that were not previously possible.

Amplitude and chromatic dispersion characteristics of optical devices for DenseWDM or Ultra-Dense-WDM can be easily measured (channel steps: 100 GHz, 50 GHz, 25 GHz, etc.).

Selectable wavelength spans from 70 nm (maximum) to approximately 0.1 nm (minimum).

High-speed measurement

Measurement time Approx. 6.7 ms (per measurement point) Approx. www.cniacs.com 4 seconds (within the specified span) The interval between scans (measurement time) is approx. 4 seconds.

This means that the Q7750 can complete a measurement in 4 seconds, whereas the previous measurement process took several tens of seconds.

If the measurement time is too long, accurate results may not be obtained because the characteristics of the device under test may change due to environmental conditions such as temperature.

The Q7750 completes measurements in a short period of time, ensuring high-speed, accurate measurements that are unaffected by the temperature characteristics of the device under test.

Key Features

– Sensitivity -92 dBm

– Polarization correlation ±0.05 dB

– Resolution bandwidth accuracy ±2

– Power Measurement

– Pulsed light measurement

Operation

In addition to amplifier analysis, a variety of display modes are available, such as

– Overlay display,

– Comparison with memory contents,

– Display of two independent graphs (split screen),

– Power meter function,

– Use of multiple markers,

– Normalized and direct readout of transmission loss and

– Automatic bandwidth analysis (e.g. measurement of half-value widths based on RMS and envelope methods),

– Curve fitting over the IEC/IEEE bus and many other features facilitate operation of the analyzer and simplify analysis.

A standard internal disk drive is used as a storage medium. Stored binary data can be analyzed with the appropriate program under MS-Windows or copied to a file and printed out.

The high-speed built-in thermal printer prints out a hard copy of the measurement results with all setup parameters in less than 10 seconds. The built-in high-speed thermal printer prints a hard copy of the measurement results with all setup parameters in less than 8 seconds.